TU Wien, Institute for Microelectronics
Prof. Tibor Grasser is an IEEE Fellow and head of the Institute for
Microelectronics at TU Wien. He has edited various books, e.g. on the bias temperature instability, hot carrier degradation, and
low-frequency noise (all with Springer), is a distinguished lecturer
of the IEEE EDS, has been involved in outstanding conferences such as IEDM (General Chair 2021), IRPS, SISPAD, ESSERC (currently Steering Committee Chair), and IIRW, is a recipient of the Best and Outstanding Paper Awards at IRPS (2008, 2010, 2012, and 2014), IPFA (2013 and 2014), ESREF (2008) and the IEEE EDS Paul Rappaport Award (2011). He served as an Associate Editor for IEEE T-ED and Microelectronics Reliability (Elsevier).
