DRC 2026 offers an in-depth short course on Sunday, June 21. Attendees gain practical knowledge from leading academic and industry instructors.

Sunday, June 21, 2026

  • Organizers: Theresia Knobloch and Michiel van Setten

    This offering aims to examine perspectives from both 2D materials transistors and thin-film transistors (TFTs), integrating viewpoints from academic and industry sectors. The course distinguishes between performance and reliability considerations, covering physically relevant metric definitions alongside operational metrics commonly employed in industry practice.

View Program Grid
Time Speaker Affiliation Talk Title
1:00 PM Aaron Franklin Affiliation Best Practices in Reporting and Benchmarking Performance of 2D Transistors: A Scaling and Contacts Story
1:50 PM Adrian Chasin IMEC Reliability Benchmark of Semiconducting Oxides Based Thin-Film Transistors: What to Measure and How to Determine Device Lifetime
2:40 PM Coffee Break
3:00 PM Tibor Grasser TU Wien, Institute for Microelectronics Reliability Issues in Devices Based on Emerging Materials
3:50 PM Becky Peterson University of Michigan TFT Performance
4:40 PM Coffee Break